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Device Under Test

a specific purpose component or module check; ex. substantial component of a PCB.

See Also: DUT, Unit Under Test, EUT


Showing results: 241 - 255 of 317 items found.

  • AC Line Splitter

    Extech 480172 - Extech Instruments Corporation

    This Extech 480172 Line Splitter provides a fast and easy way to “open” standard 120 Volt AC electrical lines, eliminating the need to cut off the plug and separate the conductors. When connected between a 120 Volt AC outlet and a device under test, this splitter separates the hot/live conductor from the neutral and ground, which enables users to measure AC current up to 15 Amp on a two-wire or three-wire lines using a clamp meter. This splitter also features two Voltage Test jacks so that voltage can be measured using a multimeter.

  • Automated Discrete Semiconductor Tester (ATE)

    5000E - Scientific Test, Inc.

    Same Proven Technology as all 5000 Series Testers. High Speed Single Test Measure. Capable of Testing Multiple and Mixed Devices. 1KV Standard, 2KV Optional. 1NA to 50A Standard, 100A Optional. 0.1NA Resolution. Complete Self Test. Auto-Calibration. RDSON to 0.1MOHM Resolution. Windows Application Software. Optional Scanner. Optional Wafer Mapping. Optional Curve Trace. MOSFET, IGBT, J-FETTriac, SCR, Sidac, Diac, Quadrac, STS, SBS Transistor, Diode, Opto, Zener Regulator, MOV, Relay. UNDER $23,000.00

  • University Kit

    Copper Mountain Technologies

    Copper Mountain Technologies’ University Kit is a complete solution designed to assist educational institutions as they teach RF skills to engineering students. The kit has three options of vector network analyzer models in 3 GHz or 8 GHz frequency range and includes the calibration module, a few devices under test (DUTs), and accessories necessary for an array of common VNA measurements. The kit also includes sample laboratory curriculum for teaching using the tools in the kit.

  • PXI FlexRIO Digital I/O Module

    NI

    The PXI FlexRIO Digital I/O Module leverages standard digital I/O with a flexible, user-defined FPGA to solve a variety of challenges, from high‐speed communication with a device under test (DUT) to emulating custom protocols in real time. You can use the PXI FlexRIO Digital I/O Module for real-time interfacing of standard protocols or implementing customized protocols. Additionally, the module features multiple directional and FPGA variants to fit different interfacing and application needs.

  • Pulse Function Arbitrary Noise Generator

    81160A - Keysight Technologies

    Generation of 330-MHz pulses and 500-MHz function/arbitrary waveforms with a 2.5-GSa/s sample rate and 14-bit vertical resolution; Selectable crest factors for white Gaussian noise lets engineers determine how much distortion to apply to a device during stress testing to meet various serial bus standards; Glitch-free timing parameter changes allow engineers to change the frequency without drop-outs or glitches and enable continuous operation without rebooting or resetting the device under test; and Arbitrary bit patterns show capacitive load of the channels using simple pattern settings. Complex measurement setups are no longer necessary to test designs to their limits. Pulses 330 MHz, 500 MHz sine waves, 660 Mbit pattern

  • PXIe-4145, 4-Channel, ±6 V, 500 mA Precision PXI Source Measure Unit

    782435-01 - NI

    PXIe, 4-Channel, ±6 V, 500 mA Precision PXI Source Measure Unit - The PXIe-4145 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4 wire) sensing for accurate measurements. The fast sample rate of the PXIe-4145 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4145 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.

  • PXIe-4141, 4-Channel, ±10 V, 100 mA, Precision PXI Source Measure Unit

    781743-01 - NI

    PXIe, 4-Channel, ±10 V, 100 mA, Precision PXI Source Measure Unit - The PXIe-4141 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4 wire) sensing for accurate measurements. The fast sample rate of the PXIe-4141 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4141 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.

  • PXIe-4143, 4-Channel, ±24 V, 150 mA Precision PXI Source Measure Unit

    782431-01 - NI

    PXIe, 4-Channel, ±24 V, 150 mA Precision PXI Source Measure Unit - The PXIe-4143 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation and each channel has integrated remote (4-wire) sensing for accurate measurements. The fast sample rate of the PXIe-4143 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4143 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.

  • Modulation Distortion For E5081A Up To 20 GHz

    S960704B - Keysight Technologies

    The Keysight S960704B modulation distortion software application enables fast and accurate active device modulation distortion characterization under modulated signal conditions up to 20 GHz. The wide dynamic range and vector error correction of the ENA-X yield an extremely low residual EVM of the test setup, delivering a complete picture of your device’s signal distortion performance without test system interference. S960704B software measures EVM, NPR, ACPR, and decomposes linear and nonlinear signals by spectrally correlating input and output spectrum without needing to demodulate. Integration with the ENA-X measurement flexibility enables quick modulated signal distortion measurements along with traditional VNA tests.

  • PXI-2547, 2.7 GHz, 50 Ω, 8x1 PXI RF Multiplexer Switch Module

    778572-47 - NI

    2.7 GHz, 50 Ω, 8x1 PXI RF Multiplexer Switch Module—The PXI‑2547 is an RF signal multiplexer switch module. The higher channel count of the PXI‑2547 makes it ideal for test systems that require the switching of a large number of RF signals, such as switching several devices under test to a single channel on the RF analyzer. The module also features excellent insertion loss, voltage standing wave ratio (VSWR), and isolation parameters to minimize signal degradation. You can use the onboard relay count tracking feature to predict relay lifetime and reduce unexpected system downtime.

  • ISI Channel Boards

    M8049A - Keysight Technologies

    The M8049A ISI channel boards can be used to emulate channel loss in receiver test setups. The boards are used to emulate channel loss for data rates of 32 Gb/s and higher. A choice of 21 PC board traces with different lengths can be inserted into the signal path. The trace lengths range from 0.8 inch (20.3 mm) to 22.3 inch (566.4 mm). By cascading the traces within one board or with another board, a wide range of channels can be emulated with very fine resolution of insertion loss steps. With their small size the ISI channel boards can be located closely to the device under test.

  • Logic Analyzer Probes

    NCI Logic Analyzers

    Three probe types are available for GoLogicXL logic analyzers: flying leadset, Mictor, and Pinpoint probes. The Mictor and Pinpoint probes are compatible with similar Keysight/Agilent "soft touch" and Tektronix "connectorless" probes. All GoLogicXL probes are coaxially shielded and use passive termination inputs to prevent loading the device under test. Both differential and single-ended input signals are supported by all probes. Input voltage swings small as 300 mV are supported in single-ended mode, and 150 mV for differential signals.

  • Current Transformer Comparator

    ZERA® WM3000I - Powermetrix Systems

    The current measuring comparator WM3000I is a high-precision device for comparing secondary outputs from a current transformer under test (or digital output of Electronic CTs or Digital CTs) with a reference signal supplied by a standard transformer primary. The resulting error value will be displayed as ratio error and phase error on the screen. The operation of the comparator will be performed via an integrated 10.1” capacitive touch screen or controlled by PC software. The WM3000I is compatible with existing systems, like Knopp, and exports a data output for active database systems.

  • External Frontend

    FE44S - Rohde & Schwarz GmbH & Co. KG

    The R&S®FE44S external frontend can extend the frequency range up to 44 GHz for Rohde&Schwarz signal and spectrum analyzers as well as signal generators. The R&S®FE44S enables signal up and downconversion directly at the device under test (DUT), lowering cable losses, increasing sensitivity and delivering more power at the antenna in an OTA environment. The R&S®FE44S uses a single RF connector to further reduce the number of antennas in over the air testing.

  • Test Fixture Kits

    Equip-Test Kft.

    More then ten years of experience in special, customized engineering and manufacturing brought us to the highest level of creating reliable, flexible and robust Test Fixtures. Currently our HQ is located in Vecsés, Hungary together with our R&D. Equip Group has Test Fixture Kit manufacturing plant in Serbia, focusing on supplying competitive, high – quality and high – volume products for the global market.With more then 180 employees, Equip – Test is able to offer our customers turnkey solutions in fixturing with test program generation. No matter if you have a simple or complex, high-density PCB (Printed Circuit Boards), or if you have DUT (Device Under Test) already assembled into metal or plastic housing, we can offer you a very stable technical solution.

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